UP105
  UNTESTABLE ANALOG TESTS DIGITAL TESTS STUCK FAULT TESTS
Pin Grid Nail Net Name Pin Attribute BScan Attribute PWR NC Analog CD TJ MDA STT VM PAT TTL MEM OBP I2C BS TPG TREE CLK Drives Senses Stuck Fault Result
1 1 1039 P_VCORE_PWM4_10 NA NA No Test
2 2 1 GND NA NA GND      
3 3 1030 P_OD_4_10 NA NA No Test
4 4 1029 P_VCORE_VCC4_R_20 NA NA VCC      
5 5 961 P_VCORE_LG4_20 NA NA       X                                      
6 6 949 P_VCORE_PHASE4_20 NA NA No Test
7 7 1022 P_VCORE_HG4_20 NA NA       X                                      
8 8 1015 P_VCORE_BST4_20 NA NA       X                                      
9 9 1 GND NA NA GND      
10 10 1 GND NA NA GND      
11 11 1 GND NA NA GND      
Total   5     3                                      

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  Analog Test Digital Test Overall
Tested Pins 3 0 3
Testable Pins 6 6 6
Coverage 50.0% 0.0% 50.0%