UUP2
| |
UNTESTABLE |
ANALOG TESTS |
DIGITAL TESTS |
STUCK FAULT TESTS |
| Pin |
Grid |
Nail |
Net Name |
Pin Attribute |
BScan Attribute |
PWR |
NC |
Analog |
CD |
TJ |
MDA |
STT |
VM |
PAT |
TTL |
MEM |
OBP |
I2C |
BS |
TPG |
TREE |
CLK |
Drives |
Senses |
Stuck Fault Result |
| 1 |
1 |
1 |
GND |
NA |
NA |
GND |
|
|
|
| 2 |
2 |
0 |
S_USB_PP7_R |
NA |
NA |
No Test |
| 3 |
3 |
622 |
S_USB_PP7 |
NA |
NA |
|
|
|
X |
|
|
|
|
|
|
|
|
|
|
|
|
|
|
|
|
|
|
|
| 4 |
4 |
1 |
GND |
NA |
NA |
GND |
|
|
|
| 5 |
5 |
0 |
S_USB_PN7_R |
NA |
NA |
No Test |
| 6 |
6 |
623 |
S_USB_PN7 |
NA |
NA |
|
|
|
X |
|
|
|
|
|
|
|
|
|
|
|
|
|
|
|
|
|
|
|
| 7 |
7 |
1 |
GND |
NA |
NA |
GND |
|
|
|
| 8 |
8 |
624 |
+5V_USB_P78 |
NA |
NA |
VCC |
|
|
|
| Total |
|
4 |
|
|
2 |
|
|
|
|
|
|
|
|
|
|
|
|
|
|
|
|
|
|
|
¡@
| |
Analog Test |
Digital Test |
Overall |
| Tested Pins |
2 |
0 |
2 |
| Testable Pins |
4 |
4 |
4 |
| Coverage |
50.0% |
0.0% |
50.0% |