UP704
  UNTESTABLE ANALOG TESTS DIGITAL TESTS STUCK FAULT TESTS
Pin Grid Nail Net Name Pin Attribute BScan Attribute PWR NC Analog CD TJ MDA STT VM PAT TTL MEM OBP I2C BS TPG TREE CLK Drives Senses Stuck Fault Result
1 1 387 P_1_0A_L+5VSB_S NA NA No Test
2 2 1 GND NA NA GND      
3 3 402 P_+1_0V_A_LP__10 NA NA No Test
4 4 403 P_+1_0V_A_PG_10 NA NA       X                                      
5 5 1 GND NA NA GND      
6 6 1 GND NA NA GND      
7 7 400 P_+1_0V_A_VOUT_10 NA NA GND*      
8 8 398 P_+1_0V_A_SW_20 NA NA GND*      
9 9 398 P_+1_0V_A_SW_20 NA NA GND*      
10 10 389 P_+1_0V_A_BST_20 NA NA       X                                      
11 11 401 +1_0V_A_VCC_20 NA NA VCC      
12 12 385 P_+1_0V_A_FB_10 NA NA       X                                      
13 13 388 P_+1_8V_A_PG_10 NA NA       X                                      
14 14 1 GND NA NA GND      
15 15 398 P_+1_0V_A_SW_20 NA NA GND*      
16 16 398 P_+1_0V_A_SW_20 NA NA GND*      
Total   10     4                                      
GND*: NET is indirectly connected to GND.

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  Analog Test Digital Test Overall
Tested Pins 4 0 4
Testable Pins 6 6 6
Coverage 66.7% 0.0% 66.7%